Flying Probe Automates your Test Application
Custom Prober Systems
Huntron Access Probers have provided economical, automated single point (probe) diagnostics of densely packed surface-mount circuit
cards assemblies (CCA) since the early 1990's. Surface mount technology has made the observation of constantly varying events a
challenge when manual measurements are needed. Huntron Access Probing Stations open the measurement
spectrum to fixtureless diagnostic robotic probing. Single or dual point systems provide accurate automation of one or two point
measurements therefore reducing the manual dexterity limits when an event needs to be captured. Huntron Access Probing Stations can be
configured to work with almost any standard measurement instrument such as Huntron Trackers, multimeters, oscilloscopes, spectrum
analyzers...
Productivity Challenges of Manually Probing High Density Circuits
Vision, Dexterity and Distractions continually limit the effectiveness and reliability of diagnostic measurements. Technicians and engineers equipped with the most advanced test instruments still have to locate the test point, place the probe and take the measurement.
- Vision Factor:
High density circuit components are difficult to see and often require magnification devices. - Dexterity Factor:
Measurement points can be small and close together. Accurate probe placement and repeatable measurements can be difficult. - Distraction Factor:
Interruptions by telephones, coworkers, pages and meetings can take their toll on completing a test procedure.
Replace Board Test Fixtures
Testing methods for low-volume and for prototype circuit boards are also be coming harder to test with the increasing complexity and density. Low-volume production runs or prototypes do not normally justify the cost of bed-of-nails in-circuit testing. The use of flying probe technology provides a cost-effective solution.
Imagine the Possibilties
The ability to automate a test procedure will yield results not in productivity but accuracy and repeatability. What type of testing can be successfully automated? Read on...
- Huntron Tracker Power-off
In repair situations it is often necessary to test the board without power applied due to uncertainty as to the nature of the failure. - Near Field Signature Analysis (NFSA)
Local synthetic measurement technology including the sensor, receiver and signal processing in one compact RF Probe assembly allows the sensing of EM fields emanating from RF circuitry. - Point-to-point Component Measurements
Accurately measure voltage, resistance, current, capacitance, inductance and differential measurements between two points on a printed circuit assembly. - Stimulus / Response Measurements (Fault Injection)
Debug, fault injection, electrical transient monitoring and sustained engineering applications. - Boundary Scan
Use of the probes as independent cells to increase test coverage of interconnects and clusters of logic, memories etc. - Guided Probe Measurements
Physical contact, minimum impact on circuit operation, adequate signal fidelity, especially for high-density surface mount technology. Passive, active, differential, logic and current probes can be mounted. - Multiple Probe Arrays
Add fixed probe arrays to access a number of points at one time. Maximum downforce is up to 5 lbs. - More???
Custom integration of unique applications such as vision, infrared mapping, temperature sensing and mechanical manipulation.
General Specifications
Huntron currently manufactures three styles of Access Robotic Probers. More detailed information is available on the Access Probers web page.
- Access Prober
Low profile, single head prober with a smaller test bed area - Access 2 Prober
Larger single head prober well suited to larger PCAs. - Access DH (Dual Head) Prober
Open architecture, two head prober suited for point-to-point testing as well as many other functions