Flexible, automated diagnostic solutions to help people solve circuit card problems.
Todays electronic test environment demands that the equipment used for diagnosing and analyzing printed circuit boards be flexible and serve multiple functions if possible. The combining of different types of test methods into integrated test systems is not a new idea but in recent years there has been a resurgence of interest in creating flexible, standards-based test platforms. Huntron has formed the Huntron Integration Service Network to provide exposure to vendors utilizing Huntron products within their integarted test systems. Below are examples of integrated test systems currently developed by Huntron Integration Service Network members.
Advanced Integration (Advint) is a veteran owned small business focused on test and measurement and process control solutions. Their PUMA Test Systems utilize Commercial Off the Shelf
(COTS) technology from several different manufacturers. The PUMA Test System is PXI/SCXI based using standard 19 inch rack mount chassis. The image below shows the PUMA Test System being used
with a TrackePXI and Huntron Access Robotic Prober. The TrackerPXI and Access Prober are controlled through
the Remote Control feature built into the Huntron Workstation software. The PUMA Test system software can make remote calls to the Workstation software to execute power-off signature analysis
test steps when needed.
DME is currently producing compact test system referred to as Advanced Tactical Agile Communications Test System (ATACTS). ATACTS addresses the complex communications
verification-testing requirement associated with 2nd-line, 3rd-Line, and Depot Test communications testing requirements. ATACTS was designed as a portable, self-contained test
set while establishing a migration path with increased capabilities to meet the growing demands of advanced digital communications systems. The image below shows an ATACTS utilizing a
Huntron Access Prober for accurate guided probe placement on sensitive PCBs. Knowing that the test probe is placed at the exact desired location helps to eliminate worries of misplacement
and accidental shorting of component pins.